[Scope]--The latest low temperature test chamber GB/T2423.1-2008 standard

The low temperature test specified in this part of GB/T2423 is applicable to non-heat and heat test samples. There is no substantial difference between the test Ab and the test Ad compared to the earlier version. The purpose of increasing the test Ae is mainly to detect those devices that require energization during the entire test process, including cooling adjustment.

The purpose of this low temperature test is limited to the ability to determine the use, transport or storage of components, equipment or other products in low temperature environments.

This low temperature test cannot be used to evaluate the ability of the test sample to withstand temperature changes and its ability to operate under temperature changes. In this case, GB/T2423.22 should be used.

The low temperature test method is subdivided into the following types:

-- Non-heating test sample low temperature test: Test Ab, temperature gradient.

-- Thermal test sample low temperature test: test Ad, temperature gradient; test Ae, temperature gradient, test sample is energized throughout the test.

The test methods given in this section are typically used for test samples that are temperature stable during the test.

The recommended equipment is DW-100 low temperature test chamber, brand YASELINE, origin Beijing, please download the official website of Beijing Yashilin Test Equipment Co., Ltd. for detailed information download.

低温试验箱GB/T2423.1-2008标准范围

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